Investigations on structural and electrical properties of Cadmium Zinc Sulfide thin films

Document Type : Reasearch Paper

Authors

• S. Sagadevan ¹
• K. Pandurangan ²

¹ Department of Physics, Sree Sastha Institute of Engineering and Technology, Chembarambakkam, Chennai 600123, India.

² Department of Physics, Madha Engineering College, Kundrathur, Chennai, India.

10.7508/ijnd.2015.04.012

Abstract

Nowadays, II – IV group semiconductor thin films have attracted considerable attention from the research community because of their wide range of application in the fabrication of solar cells and other opto-electronic devices. Cadmium zinc sulfide (Zn-CdS) thin films were grown by chemical bath deposition (CBD) technique. X-ray diffraction (XRD) is used to analyze the structure and crystallite size and scanning electron microscopy is used to study the morphology of Zn-CdS thin film. Optical studies have been carried out using UV-Visible-NIR transmission spectrum. The dielectric properties of Zn-CdS thin films have been studied in the different frequency at different temperatures. The AC conductivity study shows a normal dielectric behavior with frequency which reveals that the dispersion is due to the interfacial polarization.

Keywords

• Solar Cell
• Cadmium Zinc Sulfide
• XRD
• SEM analysis
• Dielectric constant and Dielectric loss

20.1001.1.20088868.2015.6.4.12.1

Main Subjects

• Nano Engineering
• Nanofluids and Thin Films
• Nanomaterial
• Nanophysic

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